a) Define the following terms as used in power semiconductor devices Breakover voltage ii. Peak reverse voltage [PRV) b) Briefly explain how electrical stress failures occur and their remedies c) explain safety test carried out on medical electronic equipment d) Describe how parametric amplifiers work c) Highlifht factors affecting electronic component's reliability f) Discuss common failures on electronic capacitors

Breakover voltage is the minimum voltage that must be applied across a semiconductor device to switch it from the off state to the on state. It acts as a threshold; when the voltage exceeds this level, the device conducts current. Peak reverse voltage (PRV) is the maximum reverse voltage that a semiconductor device can withstand without breaking down. Exceeding this voltage leads to irreversible damage or failure, making it crucial for designers to ensure that devices are rated appropriately for their application. Electrical stress failures usually occur when a device is subjected to voltages or currents that exceed its rated tolerances, leading to overheating, breakdown, or other failures. To combat this, careful circuit design, proper heat dissipation methods, and regular maintenance can help mitigate risks and extend component lifespan. Safety tests for medical electronic equipment include dielectric strength tests, which verify that the insulation can withstand high voltages, and leakage current tests, ensuring that no harmful currents can flow from the device to a patient. These tests are critical for patient safety and regulatory compliance. Parametric amplifiers operate based on the principle of amplifying small signals using the non-linear properties of reactive components, often capacitors or inductors. By varying the reactive component’s capacitance or inductance with a pump signal, a weak input signal gets amplified, allowing for high sensitivity in applications like radio receivers. Factors affecting electronic component reliability include temperature, humidity, mechanical stress, and the quality of materials used. Operating components outside their specified limits or in harsh environments can significantly reduce their lifespan, making it essential to consider these factors in design and selection. Common failures in electronic capacitors include dielectric breakdown, which can occur due to excessive voltage or temperature, leading to short circuits. Additionally, capacitor aging can cause their capacitance to drift, impacting circuit performance. Regular inspection and adherence to the manufacturer’s specifications can help prevent these issues.