Question
a) Define the following terms as used in power semiconductor devices
Breakover voltage
ii. Peak reverse voltage [PRV)
b) Briefly explain how electrical stress failures occur and their remedies
c) explain safety test carried out on medical electronic equipment
d) Describe how parametric amplifiers work
c) Highlifht factors affecting electronic component’s reliability
f) Discuss common failures on electronic capacitors
Breakover voltage
ii. Peak reverse voltage [PRV)
b) Briefly explain how electrical stress failures occur and their remedies
c) explain safety test carried out on medical electronic equipment
d) Describe how parametric amplifiers work
c) Highlifht factors affecting electronic component’s reliability
f) Discuss common failures on electronic capacitors
Ask by Malone Herrera. in Kenya
Jan 15,2025
Upstudy AI Solution
Tutor-Verified Answer
Answer
a) Definitions:
- Breakover Voltage: The minimum voltage needed to switch a semiconductor device from off to on.
- Peak Reverse Voltage (PRV): The maximum voltage a device can handle in reverse without conducting.
b) Electrical Stress Failures and Remedies:
Failures occur when devices are subjected to voltages or currents beyond their ratings, leading to overheating or breakdown. Remedies include ensuring proper ratings, using thermal management, implementing surge protection, and conducting regular safety tests.
Failures occur when devices are subjected to voltages or currents beyond their ratings, leading to overheating or breakdown. Remedies include ensuring proper ratings, using thermal management, implementing surge protection, and conducting regular safety tests.
c) Safety Tests on Medical Equipment:
Tests include electrical safety, leakage current, electromagnetic compatibility, and functional testing to ensure patient safety and device reliability.
Tests include electrical safety, leakage current, electromagnetic compatibility, and functional testing to ensure patient safety and device reliability.
d) Parametric Amplifiers:
These amplifiers use a nonlinear element (like a varactor diode) to amplify signals by varying its parameters with a pump signal, offering low noise and high sensitivity suitable for radio frequency systems.
These amplifiers use a nonlinear element (like a varactor diode) to amplify signals by varying its parameters with a pump signal, offering low noise and high sensitivity suitable for radio frequency systems.
e) Factors Affecting Electronic Component Reliability:
Temperature, humidity, mechanical stress, electrical stress, and manufacturing quality all impact how long components last.
Temperature, humidity, mechanical stress, electrical stress, and manufacturing quality all impact how long components last.
f) Common Capacitor Failures:
Failures include dielectric breakdown, electrolyte leakage, capacitance loss, temperature-related issues, and mechanical damage from physical stress or improper handling.
Failures include dielectric breakdown, electrolyte leakage, capacitance loss, temperature-related issues, and mechanical damage from physical stress or improper handling.
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Extra Insights
Breakover voltage is the minimum voltage that must be applied across a semiconductor device to switch it from the off state to the on state. It acts as a threshold; when the voltage exceeds this level, the device conducts current.
Peak reverse voltage (PRV) is the maximum reverse voltage that a semiconductor device can withstand without breaking down. Exceeding this voltage leads to irreversible damage or failure, making it crucial for designers to ensure that devices are rated appropriately for their application.
Electrical stress failures usually occur when a device is subjected to voltages or currents that exceed its rated tolerances, leading to overheating, breakdown, or other failures. To combat this, careful circuit design, proper heat dissipation methods, and regular maintenance can help mitigate risks and extend component lifespan.
Safety tests for medical electronic equipment include dielectric strength tests, which verify that the insulation can withstand high voltages, and leakage current tests, ensuring that no harmful currents can flow from the device to a patient. These tests are critical for patient safety and regulatory compliance.
Parametric amplifiers operate based on the principle of amplifying small signals using the non-linear properties of reactive components, often capacitors or inductors. By varying the reactive component’s capacitance or inductance with a pump signal, a weak input signal gets amplified, allowing for high sensitivity in applications like radio receivers.
Factors affecting electronic component reliability include temperature, humidity, mechanical stress, and the quality of materials used. Operating components outside their specified limits or in harsh environments can significantly reduce their lifespan, making it essential to consider these factors in design and selection.
Common failures in electronic capacitors include dielectric breakdown, which can occur due to excessive voltage or temperature, leading to short circuits. Additionally, capacitor aging can cause their capacitance to drift, impacting circuit performance. Regular inspection and adherence to the manufacturer’s specifications can help prevent these issues.
